980 search results - page 149 / 196 » Logical Testing |
GLVLSI
2010
IEEE
14 years 1 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ICFEM
2005
Springer
14 years 2 months ago
2005
Springer
Abstract. Theorem provers, model checkers, static analyzers, test generators. . . all of these and many other kinds of formal methods tools can contribute to the analysis and devel...
ICMI
2004
Springer
14 years 2 months ago
2004
Springer
One of the implicit assumptions of multi-modal interfaces is that human-computer interaction is significantly facilitated by providing multiple input and output modalities. Surpri...
OOPSLA
2010
Springer
13 years 6 months ago
2010
Springer
In this paper we propose a communication-centric approach to specifying and checking how multithreaded programs use shared memory to perform inter-thread communication. Our approa...