NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Abstract. Theorem provers, model checkers, static analyzers, test generators. . . all of these and many other kinds of formal methods tools can contribute to the analysis and devel...
One of the implicit assumptions of multi-modal interfaces is that human-computer interaction is significantly facilitated by providing multiple input and output modalities. Surpri...
In this paper we propose a communication-centric approach to specifying and checking how multithreaded programs use shared memory to perform inter-thread communication. Our approa...
Benjamin P. Wood, Adrian Sampson, Luis Ceze, Dan G...