980 search results - page 30 / 196 » Logical Testing |
AMAI
2002
Springer
13 years 7 months ago
2002
Springer
: It is claimed that human inferential apparatus offers interesting ground in order to consider the intuitions of artificial intelligence researchers about the inference patterns a...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
An approach for stuck-at-i and delay-fault testing of redundant circuits without modifying the logic is proposed. The only requirement is the ability to control both phases of eac...
FPGA
1995
ACM
13 years 11 months ago
1995
ACM
This paper presents a methodology for production-time testing of (uncustomized) segmented channel eld programmable gate arrays (FPGAs) such as those manufactured by Actel [1]. Th...
VTS
2003
IEEE
14 years 25 days ago
2003
IEEE
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detectio...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...