980 search results - page 42 / 196 » Logical Testing |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
DLOG
1998
13 years 9 months ago
1998
Effective systems for expressive description logics require a heavily-optimised subsumption checker incorporating a range of optimisation techniques. Because of the correspondence...
ICWL
2007
Springer
14 years 1 months ago
2007
Springer
In e-testing it is important to administer tests composed of good quality question items. By the term “quality” we intend the potential of an item in effectively discriminating...
IFIP
2003
Springer
14 years 24 days ago
2003
Springer
A framework is described that can be used to build and test application-level software for wireless mobile computing. It emulates the physical mobility of wireless devices by usin...