980 search results - page 47 / 196 » Logical Testing |
ITC
2003
IEEE
14 years 27 days ago
2003
IEEE
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
CORR
2010
Springer
13 years 5 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
ICALP
2007
Springer
13 years 11 months ago
2007
Springer
We study the definability of constraint satisfaction problems (CSP) in various fixed-point and infinitary logics. We show that testing the solvability of systems of equations over...
TSE
2010
13 years 6 months ago
2010
— Web script crashes and malformed dynamically-generated web pages are common errors, and they seriously impact the usability of web applications. Current tools for web-page vali...