980 search results - page 66 / 196 » Logical Testing |
PPOPP
2010
ACM
14 years 5 months ago
2010
ACM
As concurrent programming becomes prevalent, software providers are investing in concurrency libraries to improve programmer productivity. Concurrency libraries improve productivi...
ISSTA
2009
ACM
14 years 2 months ago
2009
ACM
Dynamic test generation consists of executing a program while gathering symbolic constraints on inputs from predicates encountered in branch statements, and of using a constraint ...
KBSE
2005
IEEE
14 years 1 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
VLSID
1996
IEEE
13 years 11 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
DATE
2000
IEEE
14 years 2 days ago
2000
IEEE
This paper presents a method for redundancy identification (RID) using multi-node logic implications. The algorithm discovers a large number of direct and indirect implications b...