980 search results - page 9 / 196 » Logical Testing |
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
IJCAI
2003
13 years 8 months ago
2003
Degrees of information and of contradiction are investigated within a uniform propositional framework, based on test actions. We consider that the degree of information of a propo...
SFP
2003
13 years 8 months ago
2003
G∀ST is a fully automatic test system. Given a logical property, stated as a function, it is able to generate appropriate test values, to execute tests with these values, and to ...
IFIP
2001
Springer
13 years 12 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
ITC
2003
IEEE
14 years 23 days ago
2003
IEEE
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using ci...