89 search results - page 7 / 18 » Low Power Testing of VLSI Circuits: Problems and Solutions |
ARVLSI
2001
IEEE
13 years 11 months ago
2001
IEEE
As the operating supply voltage for commercial CMOS devices falls below 2 V, research activities are underway to develop CMOS integrated circuits that can operate at supply voltag...
VTS
2003
IEEE
14 years 26 days ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
VTS
2002
IEEE
14 years 15 days ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
IOLTS
2005
IEEE
14 years 1 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...