IOLTS 2005 - PDF Preprint Papers

IOLTS 2005 IEEE International On-Line Testing Symposium

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IOLTS
2005
IEEE

206views Hardware» more IOLTS 2005»

A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage

14 years 5 months ago

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This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...

Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir

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