102 search results - page 15 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
GIS
2008
ACM
14 years 8 months ago
2008
ACM
d Abstract] K. Buchin Dept. Computer Science Utrecht University The Netherlands buchin@cs.uu.nl M. Buchin Dept. Computer Science Utrecht University The Netherlands maike@cs.uu.nl ...
KDD
1994
ACM
13 years 11 months ago
1994
ACM
: Weexemplify in this paper, howa discovery system is applied to the analysis of simulation experimentsin practical political planning, andshowwhatkind of newknowledgecan be discov...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation, It finds application in test pattern generation, delay-fault testing, combinational equivalen...
ICANN
2003
Springer
14 years 20 days ago
2003
Springer
We suggest a new approach to optimize the learning of sparse features under the constraints of explicit transformation symmetries imposed on the set of feature vectors. Given a set...