102 search results - page 1 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
TC
2008
13 years 7 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
ICCD
2002
IEEE
14 years 4 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
ISOLA
2010
Springer
13 years 5 months ago
2010
Springer
Abstract. This article deals with performance verifications of architecture models of real-time embedded systems. We focus on models verified with the real-time scheduling theory...
ATS
2002
IEEE
14 years 12 days ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...