102 search results - page 5 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
VTS
1999
IEEE
13 years 11 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
JCB
2002
13 years 7 months ago
2002
There are many algorithms to cluster sample data points based on nearness or a similarity measure. Often the implication is that points in different clusters come from different u...
MTDT
2000
IEEE
13 years 12 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
JOC
2011
12 years 10 months ago
2011
Physical random number generators (a.k.a. TRNGs) appear to be critical components of many cryptographic systems. Yet, such building blocks are still too seldom provided with a form...
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...