860 search results - page 27 / 172 » Lower Bounds on the Size of Test Data Sets |
DATE
2003
IEEE
14 years 29 days ago
2003
IEEE
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
GBRPR
2003
Springer
14 years 26 days ago
2003
Springer
Abstract. We present a new method (MIDES) to determine contraction kernels for the construction of graph pyramids. Experimentally the new method has a reduction factor higher than ...
IJISTA
2008
13 years 7 months ago
2008
Data mining methods can be used for discovering interesting patterns in manufacturing databases. These patterns can be used to improve manufacturing processes. However, data accum...
TCC
2010
Springer
14 years 4 months ago
2010
Springer
Learning is a task that generalizes many of the analyses that are applied to collections of data, and in particular, collections of sensitive individual information. Hence, it is n...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
This paper derives a methodology for developing accurate convex delay models to be used for transistor sizing. A new rich class of convex functions to model gate delay is presente...