860 search results - page 35 / 172 » Lower Bounds on the Size of Test Data Sets |
ASPDAC
1998
ACM
13 years 12 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
In their paper on the "chasm at depth four", Agrawal and Vinay have shown that polynomials in m variables of degree O(m) which admit arithmetic circuits of size 2o(m) al...
VVS
1996
IEEE
13 years 12 months ago
1996
IEEE
A method is proposed which supports the extraction of isosurfaces from irregular volume data, represented by tetrahedral decomposition, in optimal time. The method is based on a d...
HICSS
2002
IEEE
14 years 19 days ago
2002
IEEE
—Connected dominating set (CDS) has been proposed as virtual backbone or spine of wireless ad hoc networks. Three distributed approximation algorithms have been proposed in the l...
INFOCOM
2002
IEEE
14 years 18 days ago
2002
IEEE
—Connected dominating set (CDS) has been proposed as virtual backbone or spine of wireless ad hoc networks. Three distributed approximation algorithms have been proposed in the l...