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ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
14 years 2 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
ICSM
2007
IEEE
14 years 2 months ago
Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction
Test suite reduction seeks to reduce the number of test cases in a test suite while retaining a high percentage of the original suite’s fault detection effectiveness. Most appro...
Scott McMaster, Atif M. Memon
ADHOC
2008
78views more  ADHOC 2008»
13 years 7 months ago
Asymptotic uniform data-rate guarantees in large wireless networks
In this paper, we study asymptotic uniform data-rate guarantees in large wireless networks from an information-theoretic viewpoint. We consider the following question: what is the...
Xin Liu, R. Srikant
FUIN
2008
98views more  FUIN 2008»
13 years 7 months ago
A Restarted Strategy for Efficient Subsumption Testing
We study runtime distributions of subsumption testing. On graph data randomly sampled from two different generative models we observe a gradual growth of the tails of the distribut...
Ondrej Kuzelka, Filip Zelezný
NETWORKS
2010
13 years 6 months ago
A mean-variance model for the minimum cost flow problem with stochastic arc costs
This paper considers a minimum cost flow problem where arc costs are uncertain, and the decision maker wishes to minimize both the expected flow cost and the variance of this co...
Stephen D. Boyles, S. Travis Waller