41 search results - page 5 / 9 » M-trie: an efficient approach to on-chip logic minimization |
CORR
2010
Springer
13 years 4 months ago
2010
Springer
Reversible logic design has become one of the promising research directions in low power dissipating circuit design in the past few years and has found its application in low power...
CORR
2010
Springer
13 years 4 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
RECOMB
2007
Springer
14 years 7 months ago
2007
Springer
Association, or LD (linkage disequilibrium), mapping is an intensely-studied approach to gene mapping (genome-wide or in candidate regions) that is widely hoped to be able to effic...