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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
14 years 1 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
ICIP
2003
IEEE
14 years 11 months ago
Incorporating complex statistical information in active contour-based image segmentation
We propose an information-theoretic method for multi-phase image segmentation, in an active contour-based framework. Our approach is based on nonparametric density estimates, and ...
Alan S. Willsky, Anthony J. Yezzi, John W. Fisher ...
ICIP
2002
IEEE
14 years 11 months ago
Contourlets: a directional multiresolution image representation
We propose a new scheme, named contourlet, that provides a flexible multiresolution, local and directional image expansion. The contourlet transform is realized efficiently via a ...
Minh N. Do, Martin Vetterli
ICIP
2001
IEEE
14 years 11 months ago
Shape description of three-dimensional images based on medial axis
3D-shape description requires the partition of objects in different parts. In this paper, we propose a new approach based on the analysis of a 3D skeleton. The skeleton is a repre...
Alexandra Bonnassie, Françoise Peyrin, Domi...
ICASSP
2009
IEEE
14 years 4 months ago
A low-complexity spectro-temporal based perceptual model
The use of psychoacoustical masking models for audio coding applications has been wide spread over the past decades. In such applications, it is typically assumed that the origina...
Cees Taal, Richard Heusdens