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    CN
    2008
    280views more  CN 2008»
    Joint transmit power and physical carrier sensing adaptation based on loss differentiation for high density IEEE 802.11 WLAN
    13 years 9 months ago
    Joint transmit power and physical carrier sensing adaptation based on loss differentiation for high density IEEE 802.11 WLAN
    Download  www.ee.washington.edu
    In high density (HD) IEEE 802.11 WLAN, packet loss can occur due to co-channel interference (asynchronous interference) or collisions (synchronous interference). In order to effec...
    Hui Ma, Jing Zhu, Sumit Roy, Soo Young Shin
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    BMCBI
    2007
    207views more  BMCBI 2007»
    Analyzing in situ gene expression in the mouse brain with image registration, feature extraction and block clustering
    13 years 9 months ago
    Analyzing in situ gene expression in the mouse brain with image registration, feature extraction and block clustering
    Download  www.biomedcentral.com
    Background: Many important high throughput projects use in situ hybridization and may require the analysis of images of spatial cross sections of organisms taken with cellular lev...
    Manjunatha Jagalur, Chris Pal, Erik G. Learned-Mil...
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    ICDAR
    2003
    IEEE
    146views Document Analysis» more  ICDAR 2003»
    On Machine Understanding of Online Handwritten Mathematical Expressions
    14 years 2 months ago
    On Machine Understanding of Online Handwritten Mathematical Expressions
    Download  www.cse.salford.ac.uk
    This paper aims at automatic recognition of online handwritten mathematical expressions written on an electronic tablet. The proposed technique involves two major stages: symbol r...
    Utpal Garain, B. B. Chaudhuri
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    ESWA
    2008
    187views more  ESWA 2008»
    A DEA window analysis on the product family mix selection for a semiconductor fabricator
    13 years 8 months ago
    A DEA window analysis on the product family mix selection for a semiconductor fabricator
    Download  ir.lib.ncut.edu.tw
    In a competitive market, semiconductor fabricator must face an environment with multi-product types, multi-priority orders and demand changes in time. Since semiconductor fabricat...
    Shu-Hsing Chung, Amy Hsin-I Lee, He-Yau Kang, Chih...
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    CODES
    2005
    IEEE
    117views Software Engineering» more  CODES 2005»
    Dynamic phase analysis for cycle-close trace generation
    14 years 2 months ago
    Dynamic phase analysis for cycle-close trace generation
    Download  cseweb.ucsd.edu
    For embedded system development, several companies provide cross-platform development tools to aid in debugging, prototyping and optimization of programs. These are full system em...
    Cristiano Pereira, Jeremy Lau, Brad Calder, Rajesh...
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