4193 search results - page 642 / 839 » Measurable Categories |
141
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DAC
2009
ACM
16 years 4 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
128
Voted
DAC
2009
ACM
16 years 4 months ago
2009
ACM
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
108
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DAC
2007
ACM
16 years 4 months ago
2007
ACM
Twisted differential line structure can effectively reduce crosstalk noise on global bus, which foresees a wide applicability. However, measured performance based on fabricated ci...
139
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DAC
2002
ACM
16 years 4 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
138
Voted
DAC
2003
ACM
16 years 4 months ago
2003
ACM
Conventionally, microarchitecture designs are mainly guided by the maximum throughput (measured as IPC) and fail to evaluate the impact of architectural decisions on the physical ...