260 search results - page 22 / 52 » Measuring power and temperature from real processors |
FAST
2003
13 years 10 months ago
2003
Excessive power consumption is a major barrier to the market acceptance of hard disks in mobile electronic devices. Studying and reducing power consumption, however, often involve...
MICRO
2011
IEEE
13 years 24 days ago
2011
IEEE
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
ISQED
2011
IEEE
13 years 24 days ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
ISCA
2005
IEEE
14 years 2 months ago
2005
IEEE
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
CASES
2008
ACM
13 years 11 months ago
2008
ACM
Although CMOS feature size scaling has been the source of dramatic performance gains, it has lead to mounting reliability concerns due to increasing power densities and on-chip te...