Excessive power consumption is a major barrier to the market acceptance of hard disks in mobile electronic devices. Studying and reducing power consumption, however, often involve...
John Zedlewski, Sumeet Sobti, Nitin Garg, Fengzhou...
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
Vijay Janapa Reddi, Svilen Kanev, Wonyoung Kim, Si...
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, J...
Although CMOS feature size scaling has been the source of dramatic performance gains, it has lead to mounting reliability concerns due to increasing power densities and on-chip te...
Shantanu Gupta, Shuguang Feng, Amin Ansari, Jason ...