273 search results - page 7 / 55 » Mechanization for solving SPP by reducing order method |
137
Voted
CP
2007
Springer
15 years 7 months ago
2007
Springer
Recent research has focused on using the power of look-ahead to speed up the resolution of the Max-SAT problem. Indeed, look-ahead techniques such as Unit Propagation (UP) allow to...
136
Voted
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
148
Voted
SIGECOM
2003
ACM
15 years 8 months ago
2003
ACM
Some recent trends in business and manufacturing hold the promise of greater profits, yet, due to profit-robbing inventory increases, this promise has not been fully realized. [9]...
129
click to vote
VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
121
Voted
DAC
1995
ACM
15 years 7 months ago
1995
ACM
To save memory, layout-to-circuit extractors that use the Finite-Element Method for resistance extraction usually solve the corresponding set of equations with a frontal solution ...