In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different exposures)...
Andrew B. Kahng, Chul-Hong Park, Xu Xu, Hailong Ya...
:: This talk deals with fundamental aspects of Intelligent Pattern Recognition (IPR) and applications. It basically includes the following: Overview of 3D Biometric Technology and ...
Pattern recognition is an important aspect of a dominant technology such as machine intelligence. Domain specific fuzzy-neuro models particularly for the ‘black box’ implemen...
Sundaramoorthy Rajasekaran, Vasantha Kalyani David
Abstract—Accelerating multi-pattern matching is a critical issue in building high-performance deep packet inspection systems. Achieving high-throughputs while reducing both memor...
The design, development, and use of complex systems models raises a unique class of challenges and potential pitfalls, many of which are commonly recurring problems. Over time, res...