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MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
14 years 3 months ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken
VISUALIZATION
2003
IEEE
14 years 3 months ago
Visualizing Industrial CT Volume Data for Nondestructive Testing Applications
This paper describes a set of techniques developed for the visualization of high-resolution volume data generated from industrial computed tomography for nondestructive testing (N...
Runzhen Huang, Kwan-Liu Ma, Patrick S. McCormick, ...
CASES
2003
ACM
14 years 3 months ago
Encryption overhead in embedded systems and sensor network nodes: modeling and analysis
Recent research in sensor networks has raised issues of security for small embedded devices. Security concerns are motivated by the deployment of a large number of sensory devices...
Ramnath Venugopalan, Prasanth Ganesan, Pushkin Ped...
DOCENG
2003
ACM
14 years 3 months ago
A structural adviser for the XML document authoring
Since the XML format became a de facto standard for structured documents, the IT research and industry have developed a number of XML editors to help users produce structured docu...
Boris Chidlovskii
DOLAP
2003
ACM
14 years 3 months ago
Achieving adaptivity for OLAP-XML federations
Motivated by the need for more flexible OLAP systems, this paper presents work on logical integration of external data in OLAP databases, carried out in cooperation between the D...
Dennis Pedersen, Torben Bach Pedersen
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