ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
This paper describes a set of techniques developed for the visualization of high-resolution volume data generated from industrial computed tomography for nondestructive testing (N...
Runzhen Huang, Kwan-Liu Ma, Patrick S. McCormick, ...
Recent research in sensor networks has raised issues of security for small embedded devices. Security concerns are motivated by the deployment of a large number of sensory devices...
Since the XML format became a de facto standard for structured documents, the IT research and industry have developed a number of XML editors to help users produce structured docu...
Motivated by the need for more flexible OLAP systems, this paper presents work on logical integration of external data in OLAP databases, carried out in cooperation between the D...