81 search results - page 5 / 17 » Methods to reduce test application time for accumulator-base... |
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
ISQED
2003
IEEE
14 years 1 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
ENTCS
2007
13 years 8 months ago
2007
Several model-checker based methods to automated test-case generation have been proposed recently. The performance and applicability largely depends on the complexity of the model...
CORR
2008
Springer
13 years 8 months ago
2008
Springer
Research on formulae production in spreadsheets has established the practice as high risk yet unrecognised as such by industry. There are numerous software applications that are d...