Sciweavers

81 search results - page 7 / 17
» Methods to reduce test application time for accumulator-base...
Sort
View
DSN
2002
IEEE
14 years 1 months ago
Time-Constrained Failure Diagnosis in Distributed Embedded Systems
—Advanced automotive control applications such as steer-by-wire are typically implemented as distributed systems comprising many embedded processors, sensors, and actuators inter...
Nagarajan Kandasamy, John P. Hayes, Brian T. Murra...
TR
2010
159views Hardware» more  TR 2010»
13 years 3 months ago
Accelerated Degradation Tests Applied to Software Aging Experiments
Abstract--In the past ten years, the software aging phenomenon has been systematically researched, and recognized by both academic, and industry communities as an important obstacl...
Rivalino Matias, Pedro Alberto Barbetta, Kishor S....
TVLSI
2008
133views more  TVLSI 2008»
13 years 8 months ago
Test Data Compression Using Selective Encoding of Scan Slices
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
Zhanglei Wang, Krishnendu Chakrabarty
ISCAS
2002
IEEE
92views Hardware» more  ISCAS 2002»
14 years 1 months ago
Low cost floating-point unit design for audio applications
This paper presents a low-cost, single-cycle floating-point unit developed for digital audio processing applications. In the unit, the serial steps of floating-point operations ar...
Sung-Won Lee, In-Cheol Park
PR
2006
229views more  PR 2006»
13 years 8 months ago
FS_SFS: A novel feature selection method for support vector machines
In many pattern recognition applications, high-dimensional feature vectors impose a high computational cost as well as the risk of "overfitting". Feature Selection addre...
Yi Liu, Yuan F. Zheng