Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
Paolo Bernardi, Michelangelo Grosso, Maurizio Reba...
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
— Testing SoC is a challenging task, especially when addressing complex and highfrequency devices. Among the different techniques that can be exploited, Software-Based Selft-Test...
Wilson J. Perez, Jaime Velasco-Medina, Danilo Ravo...
We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual co...