14 search results - page 3 / 3 » Minimizing Sensitivity to Delay Variations in High-Performan... |
TVLSI
2008
13 years 7 months ago
2008
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
With process scaling, leakage power reduction has become one of the most important design concerns. Multi-threshold techniques have been used to reduce runtime leakage power witho...
DAC
2009
ACM
14 years 2 months ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...