2 search results - page 1 / 1 » Mixed Loopback BiST for RF Digital Transceivers |
DFT
2004
IEEE
13 years 10 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
DATE
2005
IEEE
14 years 19 days ago
2005
IEEE
The idea of design domain specific Mother Model of IP block family as a base of modeling of system integration is presented here. A common reconfigurable Mother Model for ten diff...