Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
Alex Shye, Tipp Moseley, Vijay Janapa Reddi, Josep...
In deep submicron circuits, thermal hot spots and high temperature gradients increase the cooling costs, and degrade reliability and performance. In this paper, we propose a low-co...
With technology scaling, manufacture-time and in-field permanent faults are becoming a fundamental problem. Multi-core architectures with spares can tolerate them by detecting an...
Shuou Nomura, Matthew D. Sinclair, Chen-Han Ho, Ve...
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
Vijay Janapa Reddi, Svilen Kanev, Wonyoung Kim, Si...
Parallel software is increasingly necessary to take advantage of multi-core architectures, but it is also prone to concurrency bugs which are particularly hard to avoid, find, an...