225 search results - page 27 / 45 » Model Based Test Generation for Microprocessor Architecture ... |
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
In this paper, we propose a new architecture-level parameterized transient thermal behavioral modeling algorithm for emerging thermal related design and optimization problems for ...
LCPC
2004
Springer
14 years 28 days ago
2004
Springer
Abstract. Branch predictors are associated with critical design issues for nowadays instruction greedy processors. We study two important domains where the optimization of decision...
ECRTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Today’s CPUs consume a significant amount of power and generate a high amount of heat, requiring an active cooling system to support reliable operations. In case of cooling sys...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ISPASS
2005
IEEE
14 years 1 months ago
2005
IEEE
Performance evaluation using only a subset of programs from a benchmark suite is commonplace in computer architecture research. This is especially true during early design space e...