5015 search results - page 964 / 1003 » Model Checking a Path |
SIGSOFT
2007
ACM
14 years 8 months ago
2007
ACM
Because of the growing complexity of wireless sensor network applications (WSNs), traditional software development tools are being developed that are specifically designed for the...
HPCA
2008
IEEE
14 years 8 months ago
2008
IEEE
Increases in peak current draw and reductions in the operating voltages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. Noise-...
SIGMOD
2009
ACM
14 years 7 months ago
2009
ACM
The query models of the recent generation of very large scale distributed (VLSD) shared-nothing data storage systems, including our own PNUTS and others (e.g. BigTable, Dynamo, Ca...
EUROSYS
2009
ACM
14 years 4 months ago
2009
ACM
Device drivers are notorious for being a major source of failure in operating systems. In analysing a sample of real defects in Linux drivers, we found that a large proportion (39...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...