3031 search results - page 17 / 607 » Model Driven Testing Based on Test History |
DEXAW
2000
IEEE
14 years 26 days ago
2000
IEEE
Users of hypertext systems like the World Wide Web (WWW) often find themselves following hypertext links deeper and deeper, only to find themselves “lost” and unable to fin...
VTS
2002
IEEE
14 years 1 months ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
DAC
2011
ACM
12 years 8 months ago
2011
ACM
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation te...
ECMDAFA
2009
Springer
14 years 3 months ago
2009
Springer
The size and the number of models is drastically increasing, preventing organizations from fully exploiting Model Driven Engineering benefits. Regarding this problem of scalabilit...
AMS
2007
Springer
14 years 2 months ago
2007
Springer
Abstract Walking, running and hopping are based on self-stabilizing oscillatory activity. In contrast, aiming movements serve to direct a limb to a desired location and demand a qu...