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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
DSD
2009
IEEE
118views Hardware» more  DSD 2009»
13 years 11 months ago
On the Risk of Fault Coupling over the Chip Substrate
—Duplication and comparison has proven to be an efficient method for error detection. Based on this generic principle dual core processor architectures with output comparison ar...
Peter Tummeltshammer, Andreas Steininger
APN
2008
Springer
13 years 9 months ago
Hierarchical Set Decision Diagrams and Automatic Saturation
Shared decision diagram representations of a state-space have been shown to provide efficient solutions for model-checking of large systems. However, decision diagram manipulation ...
Alexandre Hamez, Yann Thierry-Mieg, Fabrice Kordon
EON
2008
13 years 9 months ago
Abductive Synthesis of the Mediator Scenario with jABC and GEM
We reuse here the framework, the setting, and the semantic modelling for the automated synthesis of the SWS Challenge Mediator presented in the companion paper [5], and show how to...
Christian Kubczak, Tiziana Margaria, Matthias Kais...
AAAI
2006
13 years 9 months ago
Characterizing Data Complexity for Conjunctive Query Answering in Expressive Description Logics
Description Logics (DLs) are the formal foundations of the standard web ontology languages OWL-DL and OWL-Lite. In the Semantic Web and other domains, ontologies are increasingly ...
Magdalena Ortiz, Diego Calvanese, Thomas Eiter