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VLSID
2002
IEEE
97views VLSI» more  VLSID 2002»
14 years 9 months ago
Multiple Faults: Modeling, Simulation and Test
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...
ICASSP
2011
IEEE
13 years 18 days ago
Dirichlet Mixture Models of neural net posteriors for HMM-based speech recognition
In this paper, we present a novel technique for modeling the posterior probability estimates obtained from a neural network directly in the HMM framework using the Dirichlet Mixtu...
Balakrishnan Varadarajan, Garimella S. V. S. Sivar...
ICST
2008
IEEE
14 years 3 months ago
On Combining Multi-formalism Knowledge to Select Models for Model Transformation Testing
Testing remains a major challenge for model transformation development. Test models that are used as test data for model transformations, are constrained by various sources of kno...
Sagar Sen, Benoit Baudry, Jean-Marie Mottu
NAACL
2003
13 years 10 months ago
A Generative Probabilistic OCR Model for NLP Applications
In this paper, we introduce a generative probabilistic optical character recognition (OCR) model that describes an end-to-end process in the noisy channel framework, progressing f...
Okan Kolak, William J. Byrne, Philip Resnik
ECCV
2008
Springer
14 years 10 months ago
A Generative Shape Regularization Model for Robust Face Alignment
In this paper, we present a robust face alignment system that is capable of dealing with exaggerating expressions, large occlusions, and a wide variety of image noises. The robustn...
Leon Gu, Takeo Kanade