During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
Smita Krishnaswamy, Stephen Plaza, Igor L. Markov,...
High performance circuit techniques such as domino logic have migrated from the microprocessor world into more mainstream ASIC designs. The problem is that domino logic comes at a...
This paper details the development, implementation, and results of Synthia, a system for the synthesis of Finite State Machines (FSMs) to field-programmable logic. Our approach us...
George A. Constantinides, Peter Y. K. Cheung, Wayn...
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...