170 search results - page 7 / 34 » Modeling and analyzing NBTI in the presence of Process Varia... |
ICASSP
2009
IEEE
14 years 2 months ago
2009
IEEE
—Multi-input multi-output (MIMO) receivers have generally been designed and their communication performance analyzed under the assumption of additive Gaussian noise. Wireless tra...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
VTS
2000
IEEE
14 years 3 hour ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
JSAC
2006
13 years 7 months ago
2006
The symbol error probability (SEP) performance of time-hopping (TH) ultra-wideband (UWB) systems in the presence of multiuser interference (MUI) and timing jitter is considered wit...