4156 search results - page 805 / 832 » Modeling and simulation of retrieving process |
CVPR
2009
IEEE
14 years 4 months ago
2009
IEEE
Recent years have seen the development of fast and accurate algorithms for detecting objects in images. However, as the size of the scene grows, so do the running-times of these a...
MICRO
2008
IEEE
14 years 4 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
QEST
2008
IEEE
14 years 4 months ago
2008
IEEE
This paper characterizes the workload seen at the storage subsystem of an e-commerce system. Measurements are conducted on multi-tiered systems running three different benchmarks,...
SMC
2007
IEEE
14 years 3 months ago
2007
IEEE
—This paper considers the problem of temporally fusing classifier outputs to improve the overall diagnostic classification accuracy in safety-critical systems. Here, we discuss d...
SP
2007
IEEE
14 years 3 months ago
2007
IEEE
Hardware manufacturers are increasingly outsourcing their IC fabrication work overseas due to much lower costs. This poses a significant security risk for ICs used for critical m...