Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
— To increase the amount of logic available in SRAM-based FPGAs manufacturers are using nanometric technologies to boost logic density and reduce prices. However, nanometric scal...
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
Christian J. Hescott, Drew C. Ness, David J. Lilja
While dedicated technologies such as e.g., Sun’s J2ME MIDP offer a simple programming model for mobile applications, appropriate support for modularizing the implementation of t...
Aspect-oriented software development (AOSD) techniques support systematic modularization and composition of crosscutting concerns. Though AOSD techniques have been proposed to han...