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MICRO
2006
IEEE
159views Hardware» more  MICRO 2006»
13 years 7 months ago
MRF Reinforcer: A Probabilistic Element for Space Redundancy in Nanoscale Circuits
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
DDECS
2007
IEEE
140views Hardware» more  DDECS 2007»
14 years 1 months ago
A Framework for Self-Healing Radiation-Tolerant Implementations on Reconfigurable FPGAs
— To increase the amount of logic available in SRAM-based FPGAs manufacturers are using nanometric technologies to boost logic density and reduce prices. However, nanometric scal...
Manuel G. Gericota, Luís F. Lemos, Gustavo ...
DSD
2007
IEEE
105views Hardware» more  DSD 2007»
14 years 1 months ago
Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
Christian J. Hescott, Drew C. Ness, David J. Lilja
HICSS
2005
IEEE
117views Biometrics» more  HICSS 2005»
14 years 1 months ago
MobCon: A Generative Middleware Framework for Java Mobile Applications
While dedicated technologies such as e.g., Sun’s J2ME MIDP offer a simple programming model for mobile applications, appropriate support for modularizing the implementation of t...
Vasian Cepa, Mira Mezini
RE
2004
Springer
14 years 23 days ago
From Aspectual Requirements to Proof Obligations for Aspect-Oriented Systems
Aspect-oriented software development (AOSD) techniques support systematic modularization and composition of crosscutting concerns. Though AOSD techniques have been proposed to han...
Shmuel Katz, Awais Rashid