As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. ...
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
In a later stage of a VLSI design, it is quite often to modify a design implementation to accommodate the new specification, design errors, or to meet design constraints. In addit...
Designing semiconductor cluster tool systems is a complicated task due to the nature of automatic operations and various configurations of modules and task response priorities of ...
In this paper we describe the system we developed for taking part in monolingual Spanish and English tasks at ResPubliQA 2009. Our system was composed by an IR phase focused on im...