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DAC
1999
ACM
14 years 3 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ASPDAC
2005
ACM
14 years 19 days ago
2005
ACM
In a later stage of a VLSI design, it is quite often to modify a design implementation to accommodate the new specification, design errors, or to meet design constraints. In addit...
WSC
2000
13 years 12 months ago
2000
Designing semiconductor cluster tool systems is a complicated task due to the nature of automatic operations and various configurations of modules and task response priorities of ...
CLEF
2009
Springer
13 years 11 months ago
2009
Springer
In this paper we describe the system we developed for taking part in monolingual Spanish and English tasks at ResPubliQA 2009. Our system was composed by an IR phase focused on im...