—Robust circuit design has become a major concern for nanoscale technologies. As a consequence, for design validation, not only the functionality of a circuit has to be considere...
Marc Hunger, Sybille Hellebrand, Alejandro Czutro,...
Hardware Trojans in integrated circuits and systems have become serious concern to fabless semiconductor industry and government agencies in recent years. Most of the previously p...
Hassan Salmani, Mohammad Tehranipoor, Jim Plusquel...
We revisit voltage partitioning problem when the mapped voltages of functional units are predetermined. If energy consumption is estimated by formulation E = CV 2 , a published wo...
Tao Lin, Sheqin Dong, Bei Yu, Song Chen, Satoshi G...
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...