We initiate a systematic study of a special type of property testers. These testers consist of repeating a basic test for a number of times that depends on the proximity parameter...
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
The aim of passive testing is to detect faults in a system while observing the system during normal operation, that is, without forcing the system to specialized inputs explicitly ...
Arun N. Netravali, Krishan K. Sabnani, Ramesh Visw...
- This paper presents a comparison between three different high-level modeling approaches for embedded systems design, focusing on systems that require dataflow models. The propose...
Lisane B. de Brisolara, Leandro Buss Becker, Luigi...
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...