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STOC
2009
ACM
14 years 9 months ago
2009
ACM
We initiate a systematic study of a special type of property testers. These testers consist of repeating a basic test for a number of times that depends on the proximity parameter...
EVOW
2001
Springer
14 years 1 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
FORTE
2003
13 years 10 months ago
2003
The aim of passive testing is to detect faults in a system while observing the system during normal operation, that is, without forcing the system to specialized inputs explicitly ...
ASPDAC
2005
ACM
14 years 2 months ago
2005
ACM
- This paper presents a comparison between three different high-level modeling approaches for embedded systems design, focusing on systems that require dataflow models. The propose...
DAC
1996
ACM
14 years 23 days ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...