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VLSID
2002
IEEE
131views VLSI» more  VLSID 2002»
14 years 9 months ago
Divide-and-Conquer IDDQ Testing for Core-Based System Chips
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
C. P. Ravikumar, Rahul Kumar
ICSE
2007
IEEE-ACM
14 years 8 months ago
Randomized Differential Testing as a Prelude to Formal Verification
Most flight software testing at the Jet Propulsion Laboratory relies on the use of hand-produced test scenarios and is executed on systems as similar as possible to actual mission...
Alex Groce, Gerard J. Holzmann, Rajeev Joshi
ICSE
2005
IEEE-ACM
14 years 2 months ago
Observations and lessons learned from automated testing
This report addresses some of our observations made in a dozen of projects in the area of software testing, and more specifically, in automated testing. It documents, analyzes and...
Stefan Berner, Roland Weber, Rudolf K. Keller
FPGA
1995
ACM
110views FPGA» more  FPGA 1995»
14 years 7 days ago
Testing of Uncustomized Segmented Channel Field Programmable Gate Arrays
This paper presents a methodology for production-time testing of (uncustomized) segmented channel eld programmable gate arrays (FPGAs) such as those manufactured by Actel [1]. Th...
Tong Liu, Wei-Kang Huang, Fabrizio Lombardi
COGSCI
2007
85views more  COGSCI 2007»
13 years 8 months ago
Semantic Boost on Episodic Associations: An Empirically-Based Computational Model
Words become associated following repeated co-occurrence episodes. This process might be further determined by the semantic characteristics of the words. The present study focused...
Yaron Silberman, Shlomo Bentin, Risto Miikkulainen