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DATE
2009
IEEE
93views Hardware» more  DATE 2009»
14 years 2 months ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
ICC
2000
IEEE
13 years 12 months ago
On Design of Interleavers with Practical Size for Turbo Codes
- In this paper, we propose a new method to design an interleaver with practical size for turbo codes. In order to construct an optimal interleaver, we first set up the following d...
Duanyi Wang, Hisashi Kobayashi
ICSE
2003
IEEE-ACM
14 years 7 months ago
Constructing Test Suites for Interaction Testing
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
Myra B. Cohen, Peter B. Gibbons, Warwick B. Mugrid...
CORR
2010
Springer
142views Education» more  CORR 2010»
13 years 4 months ago
Constructions of Optical Queues With a Limited Number of Recirculations--Part I: Greedy Constructions
One of the main problems in all-optical packet-switched networks is the lack of optical buffers, and one feasible technology for the constructions of optical buffers is to use opt...
Jay Cheng, Cheng-Shang Chang, Sheng-Hua Yang, Tsz-...
GECCO
2009
Springer
14 years 2 months ago
On the performance effects of unbiased module encapsulation
A recent theoretical investigation of modular representations shows that certain modularizations can introduce a distance bias into a landscape. This was a static analysis, and em...
R. Paul Wiegand, Gautham Anil, Ivan I. Garibay, Oz...