2072 search results - page 3 / 415 » Multibook's test environment |
TSE
2002
13 years 6 months ago
2002
Although there has been recent research into ways to design environments that enable end users to create their own programs, little attention has been given to helping these end u...
ATS
2010
IEEE
13 years 3 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
WISES
2003
13 years 8 months ago
2003
— Testing and verification are important methods for gaining confidence in the reliability of a software product. Keeping this confidence up is especially difficult for softw...
DSD
2009
IEEE
14 years 1 months ago
2009
IEEE
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
DSD
2005
IEEE
14 years 21 days ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...