234 search results - page 15 / 47 » Multiple Faults: Modeling, Simulation and Test |
SENSYS
2010
ACM
13 years 5 months ago
2010
ACM
Wireless sensor networks (WSNs) are hard to program due to unconventional programming models used to satisfy stringent resource constraints. The common event-driven concurrent pro...
DAC
2006
ACM
13 years 9 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
PASTE
2010
ACM
14 years 27 days ago
2010
ACM
Recently there has been significant interest in employing probabilistic techniques for fault localization. Using dynamic dependence information for multiple passing runs, learnin...
BMCBI
2005
13 years 7 months ago
2005
Background: In testing for differential gene expression involving multiple serial analysis of gene expression (SAGE) libraries, it is critical to account for both between and with...