1274 search results - page 197 / 255 » N-fold integer programming |
VTS
2002
IEEE
14 years 16 days ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
CPM
2010
Springer
14 years 13 days ago
2010
Springer
Abstract. The input to the Shortest Common Superstring (SCS) problem is a set S of k words of total length n. In the classical version the output is an explicit word SCS(S) in whic...
CDC
2009
IEEE
14 years 11 days ago
2009
IEEE
Abstract— We study the problem of maximizing the aggregated revenue in sensor networks with deadline constraints. Our model is that of a sensor network that is arranged in the fo...
DAWAK
2000
Springer
13 years 12 months ago
2000
Springer
In the context of multidimensional databases implemented on relational DBMSs through star schemes, the most effective technique to enhance performances consists of materializing re...
ISCAS
1999
IEEE
13 years 12 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...