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IWANN
1995
Springer
13 years 11 months ago
Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
José Luis Bernier, Juan J. Merelo Guerv&oac...
ICECCS
2010
IEEE
158views Hardware» more  ICECCS 2010»
13 years 7 months ago
A Network Analysis of Stakeholders in Tool Visioning Process for Story Test Driven Development
Participation from all stakeholders is important in a successful software development project, especially if the development project is complex and has many stakeholders. Identify...
Shelly Park, Frank Maurer
DATE
2007
IEEE
91views Hardware» more  DATE 2007»
14 years 2 months ago
Remote testing and diagnosis of System-on-Chips using network management frameworks
This paper presents a new approach that allows remote testing and diagnosis of complex (Systems-on-Chip) and embedded IP cores. The approach extends both on-chip design-for-test (...
Oussama Laouamri, Chouki Aktouf
DATE
2008
IEEE
77views Hardware» more  DATE 2008»
14 years 2 months ago
Re-Examining the Use of Network-on-Chip as Test Access Mechanism
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
Feng Yuan, Lin Huang, Qiang Xu
EMNETS
2007
13 years 11 months ago
Increasing the reliability of wireless sensor networks with a distributed testing framework
Designing Wireless Sensor Networks (WSNs) has proven to be a slow, tedious and error-prone process due to the inherent intricacies of designing a distributed, wireless, and embedd...
Matthias Woehrle, Christian Plessl, Jan Beutel, Lo...