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    ATS
    2009
    IEEE
    92views Hardware» more  ATS 2009»
    New Class of Tests for Open Faults with Considering Adjacent Lines
    14 years 5 days ago
    New Class of Tests for Open Faults with Considering Adjacent Lines
    Download  studio.db.tokushima-u.ac.jp
    Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamats...
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    DFT
    2007
    IEEE
    86views VLSI» more  DFT 2007»
    Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines
    13 years 11 months ago
    Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines
    Download  pub2.db.tokushima-u.ac.jp
    Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa,...
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