256 search results - page 42 / 52 » Noetherian Spaces in Verification |
CVPR
2003
IEEE
14 years 10 months ago
2003
IEEE
We introduce a new classification algorithm based on the concept of Symmetric Maximized Minimal distance in Subspace (SMMS). Given the training data of authentic samples and impos...
CVPR
2008
IEEE
14 years 10 months ago
2008
IEEE
The state of the art in visual object retrieval from large databases is achieved by systems that are inspired by text retrieval. A key component of these approaches is that local ...
ICCV
1999
IEEE
14 years 10 months ago
1999
IEEE
Proc. of the International Conference on Computer Vision, Corfu (Sept. 1999) An object recognition system has been developed that uses a new class of local image features. The fea...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
SIGSOFT
2003
ACM
14 years 9 months ago
2003
ACM
Although a software application always executes within a particular environment, current testing methods have largely ignored these environmental factors. Many applications execut...