With the advance of semiconductor manufacturing, There are many approaches to deal with these problems. EDA, and VLSI design technologies, circuits with even higher Adding discrete...
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
We present a novel temperature/leakage sensor, developed for high-speed, low-power, monitoring of processors and complex VLSI chips. The innovative idea is the use of 4T SRAM cell...