VLSI research, in its continuous push toward further miniaturisation, is seeking to break through the limitations of current circuit manufacture techniques by moving towards biomi...
James Smaldon, Natalio Krasnogor, Alexander Camero...
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
This paper describes a lightweight Field Programmable Gate Array (FPGA) circuit design that supports the simultaneous programming of multiple devices at different locations throug...
Logic simulation is a critical component of the design tool flow in modern hardware development efforts. It is used widely ? from high-level descriptions down to gate-level ones ?...
Debapriya Chatterjee, Andrew DeOrio, Valeria Berta...
This paper presents a novel variation of wave pipelining that we call “surfing.” In previous wave pipelined designs, timing uncertainty grows monotonically as events propagat...